EQUISPEC™ IPS IN-LINE PROCESS SPECTROPHOTOMETER

INTRODUCTION

The EquiSpec™ IPS comprises a spectrophotometer and a touchscreen industrial computer integrated into a NEMA4 stainless steel box.  The IPS is designed and equipped specifically for use in the production environment where the ambient conditions can include dust, vibrations, and variations in temperature or relative humidity.  In addition, the IPS contains a thermoelectric cooling and heating device to keep the temperature inside the box at a constant level for maximum measurement stability.

The IPS uses fiber optics and probes to illuminate the sample and transport the signal back to the analyzer.

The IPS and process probes are designed to be used in high-temperature, high-pressure and corrosive environments.

OPTO-ELECTRONIC SOLUTIONS FOR IN-LINE PROCESS MANAGEMENT

CHEMICAL MEASUREMENTS

In both lab and process settings, Process

Analytical Technology (PAT) can enhance efficiency and accuracy in chemical and pharmaceutical processes, reducing waste and maintaining end-product integrity. PAT can be the answer for challenges such as:

  • Reaction end-point determination
  • Monitoring product purity, color, and clarity
  • Monitoring concentrations of liquids, powders, and gases
  • Accountability tracking for sensitive materials
  • Cleaning validation
  • Waste reduction
  • Reaction optimization

COLOR MEASUREMENTS

Color monitoring is a critical function in various production and laboratory settings.  The environment where it can be measured includes liquids, slurries, pastes, or solids, and the measurement target could be color, haze, gloss, transmission, or yellowness.  Therefore, color monitoring is essential to:

  • Achieve greater consistency and matching in the production of pigmented materials such as plastics, paints, inks, textiles, and cosmetics
  • Maintain color matching in Masterbatch production
  • Minimize time, sampling, and scrap required to achieve color tolerance
  • Monitor color at high extrusion speeds
  • Maintain tight color tolerances

Optical

Repeatability RMS delta E (white tile)Maximum 0.01 RMS delta E CIELAB*
Inter-Instrument Agreement (LASP)Maximum 0.08 ave. delta E CIELAB*
Short-term repeatability (p-p of 20 consecutive measurements)
o   L*a*b* white tile                         
o   L*a*b* selected high chroma BCRA II
o   L*a*b* selected neutral or low chroma BCRA II
o   Spectral 420 – 680 nm, white tile, % full scale 
o   Spectral 400 – 420 & 680 – 700 nm, white tile, % full scale  
0.02
0.04
0.02
0.01
0.15
IlluminationXenon Flash
Detector1024 x 64 pixel CCD
Instrument ConfigurationsAll fiber-optic, double beam
Cross Talk< 0.5%
Spectral Range380 – 780 (refl.); 300 – 820 (trans.)
Wavelength Accuracy< ± 0.25mm
Wavelength Reproducibility< ± 0.05mm
Wavelength Resolution0.75nm, nominally w/25 micron slit
Photometric Range0 – 200% reflectance
Photometric Resolution0.001%
Measurement TimeProbe dependent; typically 1 to 5 seconds

General

Interface15 in. touch display
EnclosureNEMA 4x, TE-cooled
Dimensions62W x 58H x 24D cm (24.5 x 23.0 x 9.5 in.)
Weight45.5 kg (100 lbs.)
Mounting Holes4
o Horizontal Spacing       
o Vertical Spacing          
o Diameter                      
47.0 cm (18.5 in.), center-to-center
54.9 (21.6 in.), center-to-center
1.0 cm (0.4 in.) Accepts 3/8 in. bolts
Temperature (operating)15 – 45 °C
Electrical Requirements100-120 VAC, 2.8 A, 50 – 60 Hz
200 – 240 VAC 1.6 A, 50 – 60 Hz
External PortsUSB (2), RS-232 (1), Ethernet (1)